Gemi Grade Report
Chaos Rising
Published July 31, 2026
This Ampharos presents very strong centering and clean edges, with only an isolated minor surface scratch and uncertain corner whitening evidence. The only corner issue noted on the back was excluded from scoring due to scan quality, so the narrative is driven mainly by the clean structural scans and the single back-surface mark.
Image Quality
1 back-side defect ignored due to scan quality.
Grade Shape
Four-axis score profile
Centering is excellent on both sides, with the front measuring about 47/53 left-right and 47/53 top-bottom, and the back essentially dead center vertically with a similarly slight left-right shift. The measurements support a top-tier centering result.
Corner wear is not meaningfully established from the scored evidence. The front top-right corner note was low-resolution and uncertain, and the back top-right corner whitening was observed but excluded from scoring because it fell in an image-quality affected region.
Observed
The edge strip scans on both front and back show no edge wear defects. With no meaningful chipping, whitening, or breaks detected along the borders, the edge result is fully supported.
Surface quality is strong overall, but the back art shows a thin pale diagonal scratch-like line in the upper-left blue background. That isolated minor scratch explains a slight reduction from a perfect surface result.
Observed
Surface (9.0) is the lowest of the four axes. It's the main thing keeping this card from a higher grade.
The limiting defect is Surface Scratch (minor, back).
Bringing surface up to the level of the next-weakest axis (Centering, 10.0) would be the single biggest improvement available.
Verified
Ampharos
me04 · 090